Current Probes Capture Faster Power Electronics Signals

Article excerpt

Designed for SiC and GaN systems, the probes target high frequency current measurement challenges that emerge as power electronics switch faster.  Hioki has developed two current probes, the CT6704 and CT6705, for observing high frequency, large current waveforms in modern power electronics systems. The probes are aimed at applications such as SiC and GaN inverters, […]